SOLVED: When silicon chips are fabricated, defects in materials (e.g., silicon) and manufacturing errors can result in defective circuits. A very common defect is for one signal wire to get "broken" and always register a logical 1. This is often called a "stuck-at-1" fault. When you list instructions, assume instructions are only of the following types: loads, stores, arithmetic (R-type), arithmetic with immediate (I-type), and branches.
SOLVED: When silicon chips are fabricated, defects in materials (e.…
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Struggling to prepare thin films for defect analysis using TEM? This webinar presents an alternative— cECCI with a ZEISS FE-SEM. Discover how this new imaging technique eliminates complex sample preparation and enables you to study defects such as dislocations and stacking faults in bulk samples with clarity and efficiency.  Watch the webinar now | ZEISS Microscopy | Facebook
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