Automatic label checking: The missing step in making medical AI reliable

Researchers at Osaka Metropolitan University have discovered a practical way to detect and fix common labeling errors in ...
News-Medical.Net

Automated system improves deep learning accuracy in chest radiography analysis

Researchers at Osaka Metropolitan University have discovered a practical way to detect and fix common labeling errors in ...
IEEE

Ensemble Learning for Wafer Defect Pattern Classification in the Semiconductor Industry

Abstract: During semiconductor manufacturing, wafer defect patterns emerge in an uncontrolled environment, making immediate recognition challenging. To enhance the classification accuracy in pattern ...

Kolmogorov-Arnold networks bridge AI and scientific discovery by increasing interpretability

AI has successfully been applied in many areas of science, advancing technologies like weather prediction and protein folding ...
Phys.org

Q&A: How mathematics can reveal the depth of deep learning AI

Artificial intelligence (AI) is increasingly prevalent, integrated into phone apps, search engines and social media platforms as well as supporting myriad research applications. Of particular interest ...
IEEE

Adversarial Federated Consensus Learning for Surface Defect Classification Under Data Heterogeneity in IIoT

Abstract: The challenge of data scarcity hinders the application of deep learning (DL) in surface defect classification (SDC), as it is difficult to collect and centralize sufficient training data ...
Scientific Research Publishing

BCN-YOLO: A Deep Learning Network for PCB Defect Detection ()

To address the issues of missed detection and false detection during the defect inspection process of the PCB, an improved YOLOv7-based algorithm for PCB defect detection is proposed. Firstly, the ...
NKyTribune

CPE, DCBS launch new Community Learning Network to train health services professionals

The Kentucky Council on Postsecondary Education (CPE), in partnership with the Department for Community-Based Services (DCBS) and a consortium of postsecondary institutions, kicked off the Community ...
Semiconductor Engineering

Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)

A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...