The 350 mm diameter center opening in the RotoRing300 TM rotary table easily accommodates large 300 mm (12”) semiconductor wafers, allowing for eased extraction of the chip dies from the wafer during ...
TOKYO–Japan's Tokyo Electron Ltd. (TEL) announced Monday (April 12) that it will begin sales of a test handler that supports wafer-level packages and known-good die (KGD) products. Current process ...
ATR spectroscopy is a surface-sensitive method of infrared sampling, which is commonly used in the analysis of thin films and monolayers on surfaces. Areas that require this approach include the ...
The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback