Testing of battery cells is frequently performed on fairly large groups of cells at the same time. Before testing can begin, the cells must be properly connected to the test equipment. For cells in a ...

Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

In preparation for testing, typically the upper portion of the test fixture is connected to a load cell in the crosshead of the testing machine, and the lower portion of the fixture is connected to ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

Test and programming fixtures are great time-savers for anyone who needs to deal with more than a handful of PCBs. Instead of plugging in connectors (or awkwardly holding probe tips or wires) to ...

In-circuit test (ICT) is a time-tested and proven method of testing PCBs. During ICT, a bed-of-nails fixture provides test-instrument access to PCB nodes. Each nail is positioned such that, when the ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...