The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...
On test equipment and on boundary-scan and other DFT approaches, see: www.tmworld.com/ic and www.tmworld.com/dft. For Jay Jahangiri's elaboration on the need for ...
Semiconductor chips have been evolving to meet the demands of rapidly transforming applications, and so has the test technology to meet the test goals of those chips. Going back two decades or so, the ...
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