TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.

A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

Among all the instruments in its class, the Thermo Scientific Prisma E Scanning Electron Microscope (SEM) offers the most comprehensive solution, thanks to its sophisticated automation and extensive ...

A unique laboratory at Michigan Tech captured microscopic photography of snowflakes in a demonstration of the lab's high-powered scanning electron microscope. The Applied Chemical and Morphological ...

STEM operates by focusing a beam of electrons into a narrow probe that is scanned across a thin specimen. As the electrons interact with the sample, they are either scattered or transmitted. The ...

Coatings are required to remove or diminish the electrical charges that promptly accumulate in a nonconducting material when examined by a high-energy electron beam. Material samples investigated at ...

Physicists have designed a framework that allows scientists to observe interactions between light and electrons using a traditional scanning electron microscope. The procedure is considerably cheaper ...

The author’s visual art project is concentrated in the specific area of scientific photography of the Scanning Electron Microscope (SEM), which has expanded the boundaries of observation and ...