On visiting a high-performance GaAs fab, I was shown a problem with the measurement system. The on-wafer test system was calibrated using a power meter and on-wafer standards, using the built-in ...
As high-speed serial data rates advance beyond 50 Gb/s, conventional logic-emulating non-return-to-zero (NRZ) signaling is being replaced by PAM4, a four-level pulse amplitude-modulation scheme. PAM4 ...
Modulation bandwidths continue to grow, promising higher data rates yet imposing test difficulties. Most test technologies are still rooted in past, narrowband architectures, which are increasingly ...
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