Hierarchical test methodologies are being broadly adopted for large designs. They provide roughly an order of magnitude better ATPG (automatic test program generation) run time, reduce workstation ...

The push toward more complex integration in chips, advanced packaging, and the use of those chips for new applications is turning the test world upside down. Most people think of test as a single ...

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...

Getting an integrated circuit (IC) from design to test is an arduous process that encompasses a number of steps, including: This is an iterative process and can take months, so every step should be ...

There's a growing demand for next-generation ICs to deliver the extreme performance required for fast-evolving applications, such as AI and self-driving cars, putting tremendous pressure on the size ...

The IDDQ test relies on measuring the supply current (I DD) of an IC’s quiescent state, when the circuit isn’t switching and inputs are held at static values. Test patterns are used to place the ...