Semiconductor Engineering

The Importance Of Embedded In-Chip Monitoring In Advanced Node CMOS Technology

With advances in CMOS technology and the scaling of transistor channel lengths to nanometer (nm) dimensions, the density of digital circuits per unit area of silicon has increased as has the process ...
Semiconductor Engineering

Precise Control Needed For Copper Plating And CMP

Chipmakers are relying on machine learning for electroplating and wafer cleaning at leading-edge process nodes, augmenting traditional fault detection/classification and statistical process control in ...
EDN

Fujitsu launches RF CMOS at 65 nm

Levering their digital CMOS 65 nm process, Fujitsu announced this morning availability of PDKs and shuttle runs for a 65 nm RF CMOS process. Offering MIM and MOS capacitors, thick metal inductors, and ...
EDN

Agilent IC design tool extracts device models from semi mfg process

To allow designers to develop device-simulation models earlier in the design cycle for faster overall IC design, Santa Clara, Calif.-based Agilent Technologies Inc today rolled out what it believes is ...